| 1 | /* |
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| 2 | * linux/include/linux/mtd/nand.h |
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| 3 | * |
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| 4 | * Copyright (c) 2000 David Woodhouse <dwmw2@mvhi.com> |
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| 5 | * Steven J. Hill <sjhill@realitydiluted.com> |
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| 6 | * Thomas Gleixner <tglx@linutronix.de> |
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| 7 | * |
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| 8 | * |
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| 9 | * This program is free software; you can redistribute it and/or modify |
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| 10 | * it under the terms of the GNU General Public License version 2 as |
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| 11 | * published by the Free Software Foundation. |
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| 12 | * |
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| 13 | * Info: |
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| 14 | * Contains standard defines and IDs for NAND flash devices |
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| 15 | * |
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| 16 | * Changelog: |
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| 17 | * 01-31-2000 DMW Created |
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| 18 | * 09-18-2000 SJH Moved structure out of the Disk-On-Chip drivers |
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| 19 | * so it can be used by other NAND flash device |
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| 20 | * drivers. I also changed the copyright since none |
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| 21 | * of the original contents of this file are specific |
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| 22 | * to DoC devices. David can whack me with a baseball |
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| 23 | * bat later if I did something naughty. |
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| 24 | * 10-11-2000 SJH Added private NAND flash structure for driver |
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| 25 | * 10-24-2000 SJH Added prototype for 'nand_scan' function |
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| 26 | * 10-29-2001 TG changed nand_chip structure to support |
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| 27 | * hardwarespecific function for accessing control lines |
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| 28 | * 02-21-2002 TG added support for different read/write adress and |
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| 29 | * ready/busy line access function |
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| 30 | * 02-26-2002 TG added chip_delay to nand_chip structure to optimize |
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| 31 | * command delay times for different chips |
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| 32 | * 04-28-2002 TG OOB config defines moved from nand.c to avoid duplicate |
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| 33 | * defines in jffs2/wbuf.c |
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| 34 | * 08-07-2002 TG forced bad block location to byte 5 of OOB, even if |
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| 35 | * CONFIG_MTD_NAND_ECC_JFFS2 is not set |
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| 36 | * 08-10-2002 TG extensions to nand_chip structure to support HW-ECC |
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| 37 | * |
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| 38 | * 08-29-2002 tglx nand_chip structure: data_poi for selecting |
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| 39 | * internal / fs-driver buffer |
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| 40 | * support for 6byte/512byte hardware ECC |
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| 41 | * read_ecc, write_ecc extended for different oob-layout |
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| 42 | * oob layout selections: NAND_NONE_OOB, NAND_JFFS2_OOB, |
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| 43 | * NAND_YAFFS_OOB |
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| 44 | * 11-25-2002 tglx Added Manufacturer code FUJITSU, NATIONAL |
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| 45 | * Split manufacturer and device ID structures |
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| 46 | * |
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| 47 | * 02-08-2004 tglx added option field to nand structure for chip anomalities |
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| 48 | * 05-25-2004 tglx added bad block table support, ST-MICRO manufacturer id |
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| 49 | * update of nand_chip structure description |
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| 50 | */ |
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| 51 | #ifndef __LINUX_MTD_NAND_H |
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| 52 | #define __LINUX_MTD_NAND_H |
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| 53 | |
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| 54 | #include <linux/wait.h> |
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| 55 | #include <linux/mtd/mtd.h> |
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| 56 | |
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| 57 | struct mtd_info; |
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| 58 | /* Scan and identify a NAND device */ |
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| 59 | extern int nand_scan (struct mtd_info *mtd, int max_chips); |
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| 60 | /* Free resources held by the NAND device */ |
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| 61 | extern void nand_release (struct mtd_info *mtd); |
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| 62 | |
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| 63 | /* Read raw data from the device without ECC */ |
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| 64 | extern int nand_read_raw (struct mtd_info *mtd, uint8_t *buf, loff_t from, size_t len, size_t ooblen); |
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| 65 | |
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| 66 | |
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| 67 | /* The maximum number of NAND chips in an array */ |
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| 68 | #define NAND_MAX_CHIPS 8 |
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| 69 | |
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| 70 | /* This constant declares the max. oobsize / page, which |
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| 71 | * is supported now. If you add a chip with bigger oobsize/page |
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| 72 | * adjust this accordingly. |
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| 73 | */ |
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| 74 | #define NAND_MAX_OOBSIZE 64 |
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| 75 | |
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| 76 | /* |
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| 77 | * Constants for hardware specific CLE/ALE/NCE function |
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| 78 | */ |
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| 79 | /* Select the chip by setting nCE to low */ |
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| 80 | #define NAND_CTL_SETNCE 1 |
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| 81 | /* Deselect the chip by setting nCE to high */ |
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| 82 | #define NAND_CTL_CLRNCE 2 |
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| 83 | /* Select the command latch by setting CLE to high */ |
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| 84 | #define NAND_CTL_SETCLE 3 |
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| 85 | /* Deselect the command latch by setting CLE to low */ |
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| 86 | #define NAND_CTL_CLRCLE 4 |
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| 87 | /* Select the address latch by setting ALE to high */ |
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| 88 | #define NAND_CTL_SETALE 5 |
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| 89 | /* Deselect the address latch by setting ALE to low */ |
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| 90 | #define NAND_CTL_CLRALE 6 |
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| 91 | /* Set write protection by setting WP to high. Not used! */ |
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| 92 | #define NAND_CTL_SETWP 7 |
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| 93 | /* Clear write protection by setting WP to low. Not used! */ |
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| 94 | #define NAND_CTL_CLRWP 8 |
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| 95 | |
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| 96 | /* |
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| 97 | * Standard NAND flash commands |
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| 98 | */ |
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| 99 | #define NAND_CMD_READ0 0 |
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| 100 | #define NAND_CMD_READ1 1 |
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| 101 | #define NAND_CMD_PAGEPROG 0x10 |
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| 102 | #define NAND_CMD_READOOB 0x50 |
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| 103 | #define NAND_CMD_ERASE1 0x60 |
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| 104 | #define NAND_CMD_STATUS 0x70 |
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| 105 | #define NAND_CMD_STATUS_MULTI 0x71 |
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| 106 | #define NAND_CMD_SEQIN 0x80 |
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| 107 | #define NAND_CMD_READID 0x90 |
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| 108 | #define NAND_CMD_ERASE2 0xd0 |
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| 109 | #define NAND_CMD_RESET 0xff |
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| 110 | |
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| 111 | /* Extended commands for large page devices */ |
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| 112 | #define NAND_CMD_READSTART 0x30 |
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| 113 | #define NAND_CMD_CACHEDPROG 0x15 |
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| 114 | |
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| 115 | /* Status bits */ |
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| 116 | #define NAND_STATUS_FAIL 0x01 |
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| 117 | #define NAND_STATUS_FAIL_N1 0x02 |
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| 118 | #define NAND_STATUS_TRUE_READY 0x20 |
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| 119 | #define NAND_STATUS_READY 0x40 |
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| 120 | #define NAND_STATUS_WP 0x80 |
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| 121 | |
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| 122 | /* |
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| 123 | * Constants for ECC_MODES |
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| 124 | */ |
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| 125 | |
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| 126 | /* No ECC. Usage is not recommended ! */ |
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| 127 | #define NAND_ECC_NONE 0 |
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| 128 | /* Software ECC 3 byte ECC per 256 Byte data */ |
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| 129 | #define NAND_ECC_SOFT 1 |
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| 130 | /* Hardware ECC 3 byte ECC per 256 Byte data */ |
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| 131 | #define NAND_ECC_HW3_256 2 |
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| 132 | /* Hardware ECC 3 byte ECC per 512 Byte data */ |
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| 133 | #define NAND_ECC_HW3_512 3 |
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| 134 | /* Hardware ECC 3 byte ECC per 512 Byte data */ |
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| 135 | #define NAND_ECC_HW6_512 4 |
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| 136 | /* Hardware ECC 8 byte ECC per 512 Byte data */ |
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| 137 | #define NAND_ECC_HW8_512 6 |
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| 138 | /* Hardware ECC 12 byte ECC per 2048 Byte data */ |
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| 139 | #define NAND_ECC_HW12_2048 7 |
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| 140 | |
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| 141 | /* |
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| 142 | * Constants for Hardware ECC |
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| 143 | */ |
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| 144 | /* Reset Hardware ECC for read */ |
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| 145 | #define NAND_ECC_READ 0 |
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| 146 | /* Reset Hardware ECC for write */ |
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| 147 | #define NAND_ECC_WRITE 1 |
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| 148 | /* Enable Hardware ECC before syndrom is read back from flash */ |
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| 149 | #define NAND_ECC_READSYN 2 |
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| 150 | |
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| 151 | /* Option constants for bizarre disfunctionality and real |
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| 152 | * features |
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| 153 | */ |
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| 154 | /* Chip can not auto increment pages */ |
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| 155 | #define NAND_NO_AUTOINCR 0x00000001 |
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| 156 | /* Buswitdh is 16 bit */ |
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| 157 | #define NAND_BUSWIDTH_16 0x00000002 |
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| 158 | /* Device supports partial programming without padding */ |
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| 159 | #define NAND_NO_PADDING 0x00000004 |
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| 160 | /* Chip has cache program function */ |
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| 161 | #define NAND_CACHEPRG 0x00000008 |
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| 162 | /* Chip has copy back function */ |
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| 163 | #define NAND_COPYBACK 0x00000010 |
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| 164 | /* AND Chip which has 4 banks and a confusing page / block |
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| 165 | * assignment. See Renesas datasheet for further information */ |
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| 166 | #define NAND_IS_AND 0x00000020 |
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| 167 | /* Chip has a array of 4 pages which can be read without |
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| 168 | * additional ready /busy waits */ |
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| 169 | #define NAND_4PAGE_ARRAY 0x00000040 |
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| 170 | |
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| 171 | /* Options valid for Samsung large page devices */ |
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| 172 | #define NAND_SAMSUNG_LP_OPTIONS \ |
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| 173 | (NAND_NO_PADDING | NAND_CACHEPRG | NAND_COPYBACK) |
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| 174 | |
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| 175 | /* Macros to identify the above */ |
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| 176 | #define NAND_CANAUTOINCR(chip) (!(chip->options & NAND_NO_AUTOINCR)) |
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| 177 | #define NAND_MUST_PAD(chip) (!(chip->options & NAND_NO_PADDING)) |
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| 178 | #define NAND_HAS_CACHEPROG(chip) ((chip->options & NAND_CACHEPRG)) |
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| 179 | #define NAND_HAS_COPYBACK(chip) ((chip->options & NAND_COPYBACK)) |
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| 180 | |
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| 181 | /* Mask to zero out the chip options, which come from the id table */ |
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| 182 | #define NAND_CHIPOPTIONS_MSK (0x0000ffff & ~NAND_NO_AUTOINCR) |
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| 183 | |
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| 184 | /* Non chip related options */ |
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| 185 | /* Use a flash based bad block table. This option is passed to the |
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| 186 | * default bad block table function. */ |
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| 187 | #define NAND_USE_FLASH_BBT 0x00010000 |
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| 188 | /* The hw ecc generator provides a syndrome instead a ecc value on read |
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| 189 | * This can only work if we have the ecc bytes directly behind the |
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| 190 | * data bytes. Applies for DOC and AG-AND Renesas HW Reed Solomon generators */ |
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| 191 | #define NAND_HWECC_SYNDROME 0x00020000 |
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| 192 | |
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| 193 | |
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| 194 | /* Options set by nand scan */ |
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| 195 | /* Nand scan has allocated oob_buf */ |
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| 196 | #define NAND_OOBBUF_ALLOC 0x40000000 |
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| 197 | /* Nand scan has allocated data_buf */ |
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| 198 | #define NAND_DATABUF_ALLOC 0x80000000 |
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| 199 | |
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| 200 | |
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| 201 | /* |
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| 202 | * nand_state_t - chip states |
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| 203 | * Enumeration for NAND flash chip state |
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| 204 | */ |
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| 205 | typedef enum { |
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| 206 | FL_READY, |
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| 207 | FL_READING, |
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| 208 | FL_WRITING, |
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| 209 | FL_ERASING, |
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| 210 | FL_SYNCING, |
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| 211 | FL_CACHEDPRG, |
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| 212 | } nand_state_t; |
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| 213 | |
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| 214 | /* Keep gcc happy */ |
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| 215 | struct nand_chip; |
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| 216 | |
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| 217 | /** |
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| 218 | * struct nand_hw_control - Control structure for hardware controller (e.g ECC generator) shared among independend devices |
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| 219 | * @lock: protection lock |
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| 220 | * @active: the mtd device which holds the controller currently |
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| 221 | */ |
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| 222 | struct nand_hw_control { |
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| 223 | spinlock_t lock; |
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| 224 | struct nand_chip *active; |
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| 225 | }; |
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| 226 | |
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| 227 | /** |
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| 228 | * struct nand_chip - NAND Private Flash Chip Data |
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| 229 | * @IO_ADDR_R: [BOARDSPECIFIC] address to read the 8 I/O lines of the flash device |
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| 230 | * @IO_ADDR_W: [BOARDSPECIFIC] address to write the 8 I/O lines of the flash device |
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| 231 | * @read_byte: [REPLACEABLE] read one byte from the chip |
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| 232 | * @write_byte: [REPLACEABLE] write one byte to the chip |
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| 233 | * @read_word: [REPLACEABLE] read one word from the chip |
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| 234 | * @write_word: [REPLACEABLE] write one word to the chip |
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| 235 | * @write_buf: [REPLACEABLE] write data from the buffer to the chip |
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| 236 | * @read_buf: [REPLACEABLE] read data from the chip into the buffer |
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| 237 | * @verify_buf: [REPLACEABLE] verify buffer contents against the chip data |
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| 238 | * @select_chip: [REPLACEABLE] select chip nr |
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| 239 | * @block_bad: [REPLACEABLE] check, if the block is bad |
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| 240 | * @block_markbad: [REPLACEABLE] mark the block bad |
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| 241 | * @hwcontrol: [BOARDSPECIFIC] hardwarespecific function for accesing control-lines |
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| 242 | * @dev_ready: [BOARDSPECIFIC] hardwarespecific function for accesing device ready/busy line |
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| 243 | * If set to NULL no access to ready/busy is available and the ready/busy information |
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| 244 | * is read from the chip status register |
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| 245 | * @cmdfunc: [REPLACEABLE] hardwarespecific function for writing commands to the chip |
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| 246 | * @waitfunc: [REPLACEABLE] hardwarespecific function for wait on ready |
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| 247 | * @calculate_ecc: [REPLACEABLE] function for ecc calculation or readback from ecc hardware |
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| 248 | * @correct_data: [REPLACEABLE] function for ecc correction, matching to ecc generator (sw/hw) |
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| 249 | * @enable_hwecc: [BOARDSPECIFIC] function to enable (reset) hardware ecc generator. Must only |
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| 250 | * be provided if a hardware ECC is available |
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| 251 | * @erase_cmd: [INTERN] erase command write function, selectable due to AND support |
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| 252 | * @scan_bbt: [REPLACEABLE] function to scan bad block table |
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| 253 | * @eccmode: [BOARDSPECIFIC] mode of ecc, see defines |
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| 254 | * @eccsize: [INTERN] databytes used per ecc-calculation |
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| 255 | * @eccbytes: [INTERN] number of ecc bytes per ecc-calculation step |
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| 256 | * @eccsteps: [INTERN] number of ecc calculation steps per page |
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| 257 | * @chip_delay: [BOARDSPECIFIC] chip dependent delay for transfering data from array to read regs (tR) |
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| 258 | * @chip_lock: [INTERN] spinlock used to protect access to this structure and the chip |
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| 259 | * @wq: [INTERN] wait queue to sleep on if a NAND operation is in progress |
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| 260 | * @state: [INTERN] the current state of the NAND device |
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| 261 | * @page_shift: [INTERN] number of address bits in a page (column address bits) |
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| 262 | * @phys_erase_shift: [INTERN] number of address bits in a physical eraseblock |
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| 263 | * @bbt_erase_shift: [INTERN] number of address bits in a bbt entry |
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| 264 | * @chip_shift: [INTERN] number of address bits in one chip |
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| 265 | * @data_buf: [INTERN] internal buffer for one page + oob |
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| 266 | * @oob_buf: [INTERN] oob buffer for one eraseblock |
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| 267 | * @oobdirty: [INTERN] indicates that oob_buf must be reinitialized |
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| 268 | * @data_poi: [INTERN] pointer to a data buffer |
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| 269 | * @options: [BOARDSPECIFIC] various chip options. They can partly be set to inform nand_scan about |
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| 270 | * special functionality. See the defines for further explanation |
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| 271 | * @badblockpos: [INTERN] position of the bad block marker in the oob area |
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| 272 | * @numchips: [INTERN] number of physical chips |
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| 273 | * @chipsize: [INTERN] the size of one chip for multichip arrays |
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| 274 | * @pagemask: [INTERN] page number mask = number of (pages / chip) - 1 |
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| 275 | * @pagebuf: [INTERN] holds the pagenumber which is currently in data_buf |
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| 276 | * @autooob: [REPLACEABLE] the default (auto)placement scheme |
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| 277 | * @bbt: [INTERN] bad block table pointer |
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| 278 | * @bbt_td: [REPLACEABLE] bad block table descriptor for flash lookup |
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| 279 | * @bbt_md: [REPLACEABLE] bad block table mirror descriptor |
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| 280 | * @badblock_pattern: [REPLACEABLE] bad block scan pattern used for initial bad block scan |
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| 281 | * @controller: [OPTIONAL] a pointer to a hardware controller structure which is shared among multiple independend devices |
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| 282 | * @priv: [OPTIONAL] pointer to private chip date |
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| 283 | */ |
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| 284 | |
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| 285 | struct nand_chip { |
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| 286 | void *IO_ADDR_R; |
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| 287 | void *IO_ADDR_W; |
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| 288 | |
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| 289 | u_char (*read_byte)(struct mtd_info *mtd); |
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| 290 | void (*write_byte)(struct mtd_info *mtd, u_char byte); |
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| 291 | __u16 (*read_word)(struct mtd_info *mtd); |
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| 292 | void (*write_word)(struct mtd_info *mtd, __u16 word); |
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| 293 | |
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| 294 | void (*write_buf)(struct mtd_info *mtd, const u_char *buf, int len); |
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| 295 | void (*read_buf)(struct mtd_info *mtd, u_char *buf, int len); |
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| 296 | int (*verify_buf)(struct mtd_info *mtd, const u_char *buf, int len); |
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| 297 | void (*select_chip)(struct mtd_info *mtd, int chip); |
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| 298 | int (*block_bad)(struct mtd_info *mtd, loff_t ofs, int getchip); |
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| 299 | int (*block_markbad)(struct mtd_info *mtd, loff_t ofs); |
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| 300 | void (*hwcontrol)(struct mtd_info *mtd, int cmd); |
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| 301 | int (*dev_ready)(struct mtd_info *mtd); |
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| 302 | void (*cmdfunc)(struct mtd_info *mtd, unsigned command, int column, int page_addr); |
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| 303 | int (*waitfunc)(struct mtd_info *mtd, struct nand_chip *this, int state); |
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| 304 | int (*calculate_ecc)(struct mtd_info *mtd, const u_char *dat, u_char *ecc_code); |
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| 305 | int (*correct_data)(struct mtd_info *mtd, u_char *dat, u_char *read_ecc, u_char *calc_ecc); |
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| 306 | void (*enable_hwecc)(struct mtd_info *mtd, int mode); |
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| 307 | void (*erase_cmd)(struct mtd_info *mtd, int page); |
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| 308 | int (*scan_bbt)(struct mtd_info *mtd); |
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| 309 | int eccmode; |
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| 310 | int eccsize; |
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| 311 | int eccbytes; |
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| 312 | int eccsteps; |
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| 313 | int chip_delay; |
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| 314 | spinlock_t chip_lock; |
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| 315 | wait_queue_head_t wq; |
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| 316 | nand_state_t state; |
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| 317 | int page_shift; |
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| 318 | int phys_erase_shift; |
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| 319 | int bbt_erase_shift; |
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| 320 | int chip_shift; |
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| 321 | u_char *data_buf; |
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| 322 | u_char *oob_buf; |
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| 323 | int oobdirty; |
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| 324 | u_char *data_poi; |
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| 325 | unsigned int options; |
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| 326 | int badblockpos; |
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| 327 | int numchips; |
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| 328 | unsigned long chipsize; |
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| 329 | int pagemask; |
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| 330 | int pagebuf; |
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| 331 | struct nand_oobinfo *autooob; |
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| 332 | uint8_t *bbt; |
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| 333 | struct nand_bbt_descr *bbt_td; |
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| 334 | struct nand_bbt_descr *bbt_md; |
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| 335 | struct nand_bbt_descr *badblock_pattern; |
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| 336 | struct nand_hw_control *controller; |
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| 337 | void *priv; |
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| 338 | }; |
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| 339 | |
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| 340 | /* |
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| 341 | * NAND Flash Manufacturer ID Codes |
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| 342 | */ |
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| 343 | #define NAND_MFR_TOSHIBA 0x98 |
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| 344 | #define NAND_MFR_SAMSUNG 0xec |
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| 345 | #define NAND_MFR_FUJITSU 0x04 |
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| 346 | #define NAND_MFR_NATIONAL 0x8f |
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| 347 | #define NAND_MFR_RENESAS 0x07 |
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| 348 | #define NAND_MFR_STMICRO 0x20 |
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| 349 | |
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| 350 | /** |
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| 351 | * struct nand_flash_dev - NAND Flash Device ID Structure |
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| 352 | * |
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| 353 | * @name: Identify the device type |
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| 354 | * @id: device ID code |
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| 355 | * @pagesize: Pagesize in bytes. Either 256 or 512 or 0 |
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| 356 | * If the pagesize is 0, then the real pagesize |
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| 357 | * and the eraseize are determined from the |
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| 358 | * extended id bytes in the chip |
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| 359 | * @erasesize: Size of an erase block in the flash device. |
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| 360 | * @chipsize: Total chipsize in Mega Bytes |
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| 361 | * @options: Bitfield to store chip relevant options |
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| 362 | */ |
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| 363 | struct nand_flash_dev { |
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| 364 | char *name; |
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| 365 | int id; |
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| 366 | unsigned long pagesize; |
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| 367 | unsigned long chipsize; |
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| 368 | unsigned long erasesize; |
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| 369 | unsigned long options; |
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| 370 | }; |
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| 371 | |
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| 372 | /** |
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| 373 | * struct nand_manufacturers - NAND Flash Manufacturer ID Structure |
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| 374 | * @name: Manufacturer name |
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| 375 | * @id: manufacturer ID code of device. |
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| 376 | */ |
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| 377 | struct nand_manufacturers { |
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| 378 | int id; |
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| 379 | char * name; |
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| 380 | }; |
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| 381 | |
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| 382 | extern struct nand_flash_dev nand_flash_ids[]; |
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| 383 | extern struct nand_manufacturers nand_manuf_ids[]; |
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| 384 | |
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| 385 | /** |
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| 386 | * struct nand_bbt_descr - bad block table descriptor |
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| 387 | * @options: options for this descriptor |
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| 388 | * @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE |
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| 389 | * when bbt is searched, then we store the found bbts pages here. |
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| 390 | * Its an array and supports up to 8 chips now |
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| 391 | * @offs: offset of the pattern in the oob area of the page |
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| 392 | * @veroffs: offset of the bbt version counter in the oob are of the page |
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| 393 | * @version: version read from the bbt page during scan |
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| 394 | * @len: length of the pattern, if 0 no pattern check is performed |
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| 395 | * @maxblocks: maximum number of blocks to search for a bbt. This number of |
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| 396 | * blocks is reserved at the end of the device where the tables are |
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| 397 | * written. |
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| 398 | * @reserved_block_code: if non-0, this pattern denotes a reserved (rather than |
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| 399 | * bad) block in the stored bbt |
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| 400 | * @pattern: pattern to identify bad block table or factory marked good / |
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| 401 | * bad blocks, can be NULL, if len = 0 |
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| 402 | * |
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| 403 | * Descriptor for the bad block table marker and the descriptor for the |
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| 404 | * pattern which identifies good and bad blocks. The assumption is made |
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| 405 | * that the pattern and the version count are always located in the oob area |
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| 406 | * of the first block. |
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| 407 | */ |
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| 408 | struct nand_bbt_descr { |
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| 409 | int options; |
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| 410 | int pages[NAND_MAX_CHIPS]; |
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| 411 | int offs; |
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| 412 | int veroffs; |
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| 413 | uint8_t version[NAND_MAX_CHIPS]; |
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| 414 | int len; |
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| 415 | int maxblocks; |
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| 416 | int reserved_block_code; |
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| 417 | uint8_t *pattern; |
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| 418 | }; |
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| 419 | |
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| 420 | /* Options for the bad block table descriptors */ |
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| 421 | |
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| 422 | /* The number of bits used per block in the bbt on the device */ |
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| 423 | #define NAND_BBT_NRBITS_MSK 0x0000000F |
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| 424 | #define NAND_BBT_1BIT 0x00000001 |
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| 425 | #define NAND_BBT_2BIT 0x00000002 |
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| 426 | #define NAND_BBT_4BIT 0x00000004 |
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| 427 | #define NAND_BBT_8BIT 0x00000008 |
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| 428 | /* The bad block table is in the last good block of the device */ |
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| 429 | #define NAND_BBT_LASTBLOCK 0x00000010 |
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| 430 | /* The bbt is at the given page, else we must scan for the bbt */ |
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| 431 | #define NAND_BBT_ABSPAGE 0x00000020 |
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| 432 | /* The bbt is at the given page, else we must scan for the bbt */ |
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| 433 | #define NAND_BBT_SEARCH 0x00000040 |
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| 434 | /* bbt is stored per chip on multichip devices */ |
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| 435 | #define NAND_BBT_PERCHIP 0x00000080 |
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| 436 | /* bbt has a version counter at offset veroffs */ |
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| 437 | #define NAND_BBT_VERSION 0x00000100 |
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| 438 | /* Create a bbt if none axists */ |
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| 439 | #define NAND_BBT_CREATE 0x00000200 |
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| 440 | /* Search good / bad pattern through all pages of a block */ |
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| 441 | #define NAND_BBT_SCANALLPAGES 0x00000400 |
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| 442 | /* Scan block empty during good / bad block scan */ |
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| 443 | #define NAND_BBT_SCANEMPTY 0x00000800 |
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| 444 | /* Write bbt if neccecary */ |
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| 445 | #define NAND_BBT_WRITE 0x00001000 |
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| 446 | /* Read and write back block contents when writing bbt */ |
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| 447 | #define NAND_BBT_SAVECONTENT 0x00002000 |
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| 448 | /* Search good / bad pattern on the first and the second page */ |
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| 449 | #define NAND_BBT_SCAN2NDPAGE 0x00004000 |
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| 450 | |
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| 451 | /* The maximum number of blocks to scan for a bbt */ |
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| 452 | #define NAND_BBT_SCAN_MAXBLOCKS 4 |
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| 453 | |
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| 454 | extern int nand_scan_bbt (struct mtd_info *mtd, struct nand_bbt_descr *bd); |
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| 455 | extern int nand_update_bbt (struct mtd_info *mtd, loff_t offs); |
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| 456 | extern int nand_default_bbt (struct mtd_info *mtd); |
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| 457 | extern int nand_isbad_bbt (struct mtd_info *mtd, loff_t offs, int allowbbt); |
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| 458 | extern int nand_erase_nand (struct mtd_info *mtd, struct erase_info *instr, int allowbbt); |
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| 459 | |
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| 460 | /* |
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| 461 | * Constants for oob configuration |
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| 462 | */ |
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| 463 | #define NAND_SMALL_BADBLOCK_POS 5 |
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| 464 | #define NAND_LARGE_BADBLOCK_POS 0 |
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| 465 | |
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| 466 | #endif /* __LINUX_MTD_NAND_H */ |
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